Self-completion of the patient-generated subjective global assessment short form is feasible and is associated with increased awareness on malnutrition risk in patients with head and neck cancer
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); de Bats, Hester; Welink-Lamberts, Bertine; Gort-van Dijk, Dorienke; van der Laan, Bernard; Ottery, Faith D.; Roodenburg, Jan
High prevalence of cachexia in newly diagnosed head and neck cancer patients: an exploratory study
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); Dijkstra, Pieter; Dijkstra, Gerard; Bijzet, Johan; Langendijk, Johannes A.; van der Laan, Bernard; Roodenburg, Jan
Diagnostic accuracy of PG-SGA SF, MUST and SNAQ in patients with head and neck cancer
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); Ottery, Faith D.; de Bats, Hester; Welink-Lamberts, Bertine; van der Laan, Bernard; Roodenburg, Jan
Does completing the PG-SGA Short Form improve patient awareness regarding malnutrition risk in patients with head and neck cancer?
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); Ottery, Faith D.; de Bats, Hester; Gort-van Dijk, Dorienke; van der Laan, Bernard; Roodenburg, Jan
Agreement between PG-SGA Short Form, MUST and SNAQ in hospital patients
Angerman, Kim; de Boer, Baukje; Ottery, Faith D.; Bielderman, Annemiek; Roodenburg, J.L.N.; Krijnen, Wim (Statistical Techniques For Applied Research); van der Laan, Bernard; Jutte, Paul; Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing)
Validity of bioelectrical impedance analysis to assess fat-free mass in head and neck cancer patients
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); Dijkstra, Pieter; Earthman, Carrie; Krijnen, Wim (Statistical Techniques For Applied Research); Langendijk, Johannes; van der Laan, Bernard; Pruim, Jan; Roodenburg, Jan
Validity of bioelectrical impedance analysis to assess fat−free mass in head and neck cancer patients
Jager-Wittenaar, Harriët (Malnutrition And Healthy Ageing); Dijkstra, Pieter; Earthman, Carrie; Krijnen, Wim (Statistical Techniques For Applied Research); Langendijk, Johannes A.; van der Laan, Bernard; Pruim, Jan; Roodenburg, Jan