PATS#424110 Comprehensive Multidimensional GC and Pyrolysis-GC/MS for the Analysis of Integrated Circuit Package Materials
Teunis Hendrikus Scholten (Student)
Enabling open-source trace tooling on NXP S32K344
Ian Baak (Student)
De Wet DBA praktisch toegepast
Anne Fokkinga (Student); F.A.C. Klaassen (Begeleider)
Design of a stand alone ADC tester
Ewout Kesteloo (Student); Bert Verhage (Docent); John van Zwam (Begeleider)
Building a documentation structure for NXP Semiconductors to improve business efficiency
Loveline Ntube Mbwoge (Student); Paul Lahaije (Begeleider)
Improve CMDB
Henri den Hollander (Student); Marco A. Dorenbos (Begeleider)