This report outlines the origin of aberrations in a Low Energy Electron Microscope (LEEM) and how to measure and automatically correct them. The aberrations in a LEEM are mainly caused by the cathode objective lens and are a limiting factor for the achievable resolution. To optimise the resolution of …

Scanning tunneling microscopy is an important and enabling tool for condensed matter physics and surface science. The low temperature STM in Leiden (Prof. J. Van Ruitenbeek and Prof J. Aarts) is used for research in the field of atomic/molecular electronics and superconductivity. The current low temperature …

Increasing oil and energy demand asks for higher efficiency when it comes to oil recovery. To increase oil recovery efficiency, pore-scale mechanisms during waterflooding, a common recovery method, have to be better understood. This provides knowledge on the dynamic process during imbibition, which …